Chip Industry’s Technical Paper Roundup: Feb. 21

Industry Research LBIST for auto MCUs using a digital twin; HW-SW co-design for side-channel protected NN inference; near-memory FPGA graph processing framework; AFM & photoresists; acceleration of DL inference on edge devices; negative capacitance GAA FETs. New technical papers recently added to Semiconductor Engineering’s library: Technical Paper Research Organizations A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital

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Automotive

Automotive MCUs: Digital Twin of the LBIST Functionality

A new technical paper titled “A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin” was written by researchers at Infineon Technologies, University of Bremen, and DFKI GmbH. Abstract“LBIST has been proven to be an effective measure for reaching functional safety goals for automotive microcontrollers. Due to a large variety of recent innovative features, every customer can

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Semiconductor

Chip Industry’s Technical Paper Roundup: Feb. 14

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